网站首页公司简介新闻动态产品介绍售后服务联系我们
管理理念网站地图文件下载友情链接会员中心合作伙伴
自动测试设备
环境测试仪器
元件/安规测试仪
电源
信号源
频谱分析仪
示波器系列
投影仪系列
二次元影像测量仪系列
三次元三座标测量机
光栅数显系列
机器视觉系统
测量软件系列
投影仪选配件
显微镜系列
3D锡膏厚度测试仪
X射线检测仪(X光机)
试验机系列
表面粗糙度测试仪
硬度计系列
【名 称】 Eureka
【编 号】 0293
【类 别】 自动测试设备 -> 内存检查设备
【品 牌】 固纬
Eureka 是 R & D 、生产测试、品保 ... 等人员必需的检验仪器!
CST 首创由 PC 连控的专业 DDR/SDRAM 、 DIMM 记忆体测试机,能在同一部主机上 , 搭配不同的配备可测试 DDR266 、 SDRAM 、 RIMM 与 FPM/EDO 、 Flash 、 Cache 、 TsopChip 和模组的泄漏电流测试
特点
Eureka 对记忆模组进行快速的功能动态测试,并采用多个先进的检查模式来检测出短/断路不良、单一颗粒不良、记忆胞间的绝缘不良、时序及杂讯问题引起的间歇性不良…等
加装选购的漏电流测试转接模组后,即可进行半导体漏电流特性的测试,并能检出DRAM晶片的微小漏电流。
Eureka 具有内建的SPD(serial presence detect)烧录器可用来烧录及验证测试SPD内容,可在记忆体模组测试时随同进行。
Eureka加入了许多加强功能来提升测试的正确性,像晶片预热chip-heating,电源电压变动模拟voltage bouncing,循环(回路)测试loop test,
可调式时基adjustable timing parameters (selected),可调整式更新模式及周期alterable refresh mode and cycle,更新测试refresh test,
ICC电流测定,也有Address与RAS/CAS测试,不论有/无缓冲级的模组,Eureka都能支援同位与ECC 位元检查,
另外,Eureka也能配合CST最新的RoboFlex自动取置机 来进行全自动测试,其效能表现更是如虎添翼,此外,可额外选购加装的测试配备有Flash testing,
Cache testing,DRAM & SDRAM TSOP Chips testing
规格

DDR testing platform
Clock Frequency 200 Mhz & 266 Mhz selectable
Address Depth 4 Gigawords test capacity up to 16 row x 16 column
Data Width Expandable up to 80 bits
Timing Range -1 , 0 and 1 ns
Timing Resolution 1 ns
Vdd Range 0.1V to 2.7V with 0.1V step and 10%Bounce
Vih, Voref Range 0.1V to 2.7V with 0.1V step
Read Latency 2,3 clocks
Refresh Cycle Auto/Self Refresh - 8祍/Row
Refresh Modes Auto Refresh , Self Refresh
Leakage Test Option +/- 1礎 to +/- 5mA
Test Features Burst Mode, Programmable Data Mask, Data Strobe, and Clock Suspend Modes
Current Test Icc Standby, Icc Operating-Avg Icc up to 1.5A, Peak Curent up to 2.0A
Burst Length Programmable to 2,4,8
CAS Latency Programmable read Latency From Column Address
Serial PD 256 Bytes programmable
Testing Support Options DDR 184pin DIMM and 200pin SODIMM
SDRAM testing platform
Clock Frequency 133 mhz 100 mhz, 66mhz, 33mhz selectable
Address Depth 4 Gigawords test capacity up to 16 row x 16 column
Data Width Expandable up to 160 bits
Timing Range 0ns to 20ns in 1ns resolution
Timing Resolution in steps of 1ns resolution
Vcc Range 0.1V to 3.6V with 0.1V step and 10 %Bounce
Vih, Voref Range 0.1V to 3.6V with 0.1V step
Read Latency 1,2,3 clocks
Refresh Cycle Auto/Self Refresh - 8祍/Row to 64祍/Row
Refresh Modes RAS only, CAS before RAS, Self Refresh
Leakage Test Option +/- 1礎 to +/- 5mA
Test Features Burst Mode, Programmable Data Mask and Clock Suspend Modes
Current Test Icc Standby, Icc Operating-Avg Icc up to 1.5A, Peak Curent up to 2.0A
Burst Length Programmable to 1,2,4,8 or Full Page
CAS Latency Programmable read Latency From Column Address
Serial PD 256 Bytes programmable
Testing Support Options SDRAM 100p, 168p, 200p, 244p, 278p DIMM, 144p Sodimm, TSOP, SGRAM 144p and many more
General specifications
Power Requirements 90-130 VAC, 180-260 VAC at 50Hz or 60 Hz
Operating Temperature -20 to 100 degree Fahrenheit
Humidity 20% to 80%, non condensing
Overcurrent Protection 2A; to prevent Vcc and Ground short problems
Host Computer Requirement (Not Included) IBM PC or Compatible 386/486/Pentium with one ISA or EISA bus interface slot available for CST, Inc. proprietary interface card
Operating System Requirement (Not Included) Standard Microsoft Window Windows 95/98
 
顶部 』 『 关闭窗口
Copyright © 2018-2019 东莞市天泽精密仪器有限公司版权所有.粤ICP备10025414号
电话:0769-88983129 传真:0769-22258951